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Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

SEPTEMBER 9, 2024

For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.

Electronics 52
Electronics Contact Sensors Fit Aerospace 52
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Minimising manufacturing waste with precision

Manufacturer's Monthly

MARCH 6, 2023

Non-contact sensors may be more suitable for fast-paced manufacturing environments. Optical micrometers: Optical micrometers detect the object dimension detecting the interruption of the light path emitted from the transmitter light source to the receiver unit.

Manufacturing 52
Manufacturing Fit Contact Sensors Compliance 52
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