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Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

SEPTEMBER 9, 2024

For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.

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Minimising manufacturing waste with precision

Manufacturer's Monthly

MARCH 6, 2023

For example, roofing tiles that do not fit with each other or an extra layer of thickness of plasterboard. As such, manufacturers must implement rigorous quality control processes to ensure that their products are fit for purpose and meet the expectations of their customers.

Manufacturing 52
Manufacturing Fit Contact Sensors Compliance 52
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