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Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

THE @MARPOSS GROUP STRENGTHENS ITS PRESENCE IN SEMICONDUCTOR AND CONSUMER ELECTRONICS SEGMENT ALSO. For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection.

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Hover Sense Non-Contact Probe For EV Battery Testing Launched

Metrology

inTEST Corporation, a global supplier of innovative test and process technology solutions for use in manufacturing and testing has recently announced the launch of its Electronic Test Division’s latest innovation for electric vehicle (EV) battery testing technology.