article thumbnail

High-accuracy position sensors unaffected by magnetic fields

Design World

has introduced the LS1 series of advanced inductive linear position sensors, with stroke lengths of these non-contact sensors from 25 to 200 mm. Novotechnik U.S.

article thumbnail

AutomationDirect adds Endress+Hauser capacitance level switches to lineup

Design World

AutomationDirect has added Endress+Hauser Nivector FTI26 and Liquipoint FTW23 series point level capacitance switches to their growing lineup of level sensors. Capacitive level switches are contact sensors that detect presence by evaluating differences in dielectric values.

Insiders

Sign Up for our Newsletter

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Trending Sources

article thumbnail

Baumer’s New Capacitive Level Sensor Unhindered by Film Adhesion

Control.com

Baumer’s newest capacitive level sensor can detect liquid levels from the outside of the tank, even if the liquid is known for depositing microfilms, notorious for disrupting non-contact sensors.

article thumbnail

Onto Innovation’s 4Di InSpec Automated Metrology System Selected as Fanuc America’s 2024 Innovative System of the Year

Metrology

The combination of Fanuc robotics with 4Di non-contact sensor technologies provides a unique platform for improving throughput, labor utilization, quality and delivery times in industrial manufacturing.

article thumbnail

x-3Dsurface Provides Commercial Vehicles Chassis Geometry Measurement

Metrology

Non-contact sensor x-3Dsurface provides highly precise surface-based measurement. The post x-3Dsurface Provides Commercial Vehicles Chassis Geometry Measurement appeared first on Metrology and Quality News - Online Magazine.

article thumbnail

Contact-Type Smart Sensor

Omron

Contact-Type Smart Sensor Tough Contact Sensor

article thumbnail

Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.