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Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.

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Minimising manufacturing waste with precision

Manufacturer's Monthly

Non-contact sensors may be more suitable for fast-paced manufacturing environments. Optical micrometers: Optical micrometers detect the object dimension detecting the interruption of the light path emitted from the transmitter light source to the receiver unit.