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Onto Innovation’s 4Di InSpec Automated Metrology System Selected as Fanuc America’s 2024 Innovative System of the Year

Metrology

The combination of Fanuc robotics with 4Di non-contact sensor technologies provides a unique platform for improving throughput, labor utilization, quality and delivery times in industrial manufacturing.

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Inspection and Metrology: New Solutions for Semiconductor Industry

Dinesh Mishra

For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.

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LED Optical Micrometer Compensates For Target Tilt

Metrology

Characterised by its high precision and sampling rate with a measuring range of 40 mm, the LED micrometer is suitable for measuring contours, diameters, gaps, edges and segments in a wide range of inline quality control, automated production and machine monitoring applications.

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Minimising manufacturing waste with precision

Manufacturer's Monthly

Non-contact sensors may be more suitable for fast-paced manufacturing environments. An inline colour sensor can be integrated into the production line for this application. While it is still commonly used in various measurement applications, it is prone to inaccuracy and is limited in keeping up with the production pace.